The
organization of the third edition comes from a round table of experts
and users
present in
Since
June2004, this new edition has widely been announced at different
National and
also International Conferences, as the wish of the Speckle users to
discuss theory
and applications of the Speckle effect.
The speckle
and phase measurements are now under study in several labs and
countries.
Speckle06
will enable all researchers (from Emeritus Professors
to Ph.D.
Students) to present their work.
Participants range from experts
in techniques development to end-user interested by the application
fields (e.g. medical, forensic, fluid dynamics, optics, mechanics,
photomechanics
…)
Speckle
techniques are also widely applied in the industry, and special
attention
will be paid to industrial apparatus and off-the-shelf
component
characterization.
Speckle techniques follow evolution
in computers and cameras, and
of course the availability of Application
Specific Integrated Circuits, lasers
and coherent diodes will be taken into account.
To enhance
result quality and reliability, speckle measurements must also go
through certification
evaluation. Measurement uncertainties must be determined as
quantitative
measurements are desired.
The
official conference languages will be French and English, but
it is strongly recommended that oral presentations be
in English so that the majority of participants may understand the scientific
content.
Papers will
be selected by the International Scientific Committee for oral
presentation
or poster sessions.
Each oral presentation will last
about 20 minutes including 5 minutes for discussion.