Invitation                                                              

  The ALES School of Mines (EMA) and the previous committees (Speckle Metrology 2003 and Interferometry in Speckle Light 2000) cordially invite you to the International Conference Speckle06 “Speckles, From Grains to Flowers” in Nimes, France, from 13th -15th September 2006.

 

History                                                                          

Lasers and coherent illumination sources produce a grainy effect while shining on optically rough surfaces. This effect can appear with or without lens imaging the light of the object onto a photosensitive surface. It is called subjective or objective SPECKLE, respectively.
Lasers have been used to record holograms since the 1960’s after Gabor’s and Leith and Upatnieks’ experiments. Transmission or Reflection (Denisyuk) Holograms can record phase modulation of light intensity from the shiny shell of objects mixed with a reference beam thanks to the interference phenomenon. Some people encountered fringes in the reconstructed hologram of a “resting state” object, and have shown that these fringes were linked to the microdisplacement or the deformation of the object during the recording process.
The quantitative interpretation of these fringes led to Holographic Interferometry and Phase Computation. Quantitative phase evaluation was obtained through Phase Shifting and Phase Unwrapping (both temporal and spatial).
With the use of electronic cameras, holographic interferometry fringes were videorecorded and phase computation could be more easily applied. The poor spatial resolution and the lack of camera sensitivity forced users to open wide the lens apertures, and so speckle was not significant at this time. During the 1970’s, some clever users thought about removing the hologram plate to directly image the object surface onto the camera detector. This was achieved by the generation of “large” speckle grains while closing the aperture. The gain was immediate: no more hologram recording (even in self-developing media). This also meant increased stability facing environmental perturbations, because camera resolution was still poorer than holographic recording media. Speckle Interferometry or TV-Holography was born. In-plane and out-of-plane set-ups have been designed, and also Shearographic devices. Low coherence sources can also be used for dedicated applications in Low-Coherence Speckle Interferometry and White-Light Speckle Interferometry.
Resolutions (spatial and dynamic) of digital cameras now enable the recording of interferometric wave fronts almost like the holographic recording medium. When the required computer processor power also became available, wave propagation equations could be solved: Digital Holography was born. This allowed computer processing of the hologram and also the possibility to send it through the web via adapted compression for remote interferometric devices.
Nowadays, traditional holographic interferometry is still used by coupling a CCD camera with a self-developing crystal (e.g. BSO) to record the hologram. Evolution of optical fibers and lasers has even lead to powerful lighting systems together with this real-time holographic camera.
On the other hand, Speckle Photography (double exposure of the speckle pattern) leads to in-plane measurements through a correlation process (optical or computed).
Since the birth of Speckle Photography, cameras and computer technologies have evolved. Acquisition, phase calculation and correlation can be done in real time making the observation of static and dynamic speckles much simpler.
Sometimes laser speckle effect can be replaced by a paint tag of the object for correlation purposes. This procedure is now commonly used and is also called Digital Image Correlation. The speckle pattern is a kind of flyspeck applied on the object surface, or it is just a representative optical pattern naturally present. This technique is mainly used to measure in-plane displacements, but also 3D displacements when coupled to stereovision devices.
The main difference between speckle interferometry and speckle photography is sensitivity range. In interferometry, displacement range is related to the wavelength of the light, and then varies from nanometers to micrometers between two states. In speckle photography (or DIC), the displacement range is linked to the optical magnification of the objective, from SEM lenses to telescope mirrors …
New developments now include the possibility of associating these sensitivities. By correlating in-plane displacement fields to correct decorrelation of interferometric phase maps, interferometric measurements can be taken even when large rigid body motions occur.
Moreover we can now actively control the wavefront, the wavelength and the coherence of light sources, providing brand-new techniques of strain or displacement measurements
The use of these techniques in the lab and also in industry to obtain better quantitative and qualitative measurements is spreading rapidly. Some speckle effects are also present in “non -visible optical” techniques like Synthetic Aperture Radar, X-Ray Imaging and many others. A better understanding of the whole process is encouraged and conferences dedicated to these subjects are now widely attended…
WELCOME TO SPECKLE06

 

Scope                                                                           

  The International Conference Speckle06 “Speckles, From Grains to Flowers” will be held in Nimes, France, after Switzerland (Interferometry in Speckle light 2000) and Norway (Speckle Metrology 2003).

The organization of the third edition comes from a round table of experts and users present in Trondheim2003 and was proposed to France for 2006.

Since June2004, this new edition has widely been announced at different National and also International Conferences, as the wish of the Speckle users to discuss theory and applications of the Speckle effect.

The speckle and phase measurements are now under study in several labs and countries, and Speckle06 will enable all researchers (from Emeritus Professors to Ph.D. Students) to present their work. Participants range from experts in techniques development to end-users interested by the application fields (e.g. medical, forensic, fluid dynamics, optics or mechanics (photomechanics) …)

Speckle techniques are also widely applied in industry, and special attention will be paid to industrial apparatus and off-the-shelf components characterization.

Speckle techniques follow evolution in computers and camera, and of course the availability of Application Specific Integrated Circuits, lasers and coherent diodes will be taken into account.

To enhance result quality and reliability, speckle measurements must also go through certification evaluation. Measurement uncertainties must be determined as quantitative measurements are desired.

 

Program Topics 

 

Conference Format                                                   

The official conference languages will be French and English, but it is strongly recommended that oral presentations be in English so that the majority of participants may understand the scientific content.

Papers will be selected by the International Scientific Committee for oral presentation or poster sessions.

Each oral presentation will last about 20 minutes including 5 minutes for discussion.

Industrial exhibition will be present in different showrooms near the conference auditorium (lasers or cameras manufacturers, editors, system developers …) to promote applications and exchanges between users and manufacturers.

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