Speckle techniques can be applied to lots of objects, optically rough or not, and from nanoscopic to macroscopic sizes.
You just have to remember this:
Speckle techniques can be used to measure displacement (static, dynamic, or vibrations), strain or surface roughness.
Lasers, light sources, optics, computers, cameras, image boards, and sofwares are also really important to get the best results.
Calibration procedures and optomechanical systems have to be smart to cope with the environment too.
You will find here some applications, from the lab or from the industry. Many thanks to the author of these nice pictures for their contributions.
Last News about Dynamic Speckle Applications, the first miniaturized optical chip based on speckle translation, from Denmark (Steen G. Hanson)
http://www.pixart.com.tw/investor.asp?sort=4&learname=level03
Glossary: DIC (Digital Image Correlation), ESPI (Electronic Speckle Pattern Interferometry), TAHI (Time Averaged Holographic Interferometry)
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![]() Dan Borza's car mode shape (trunk) |
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![]() Microprocessor Shear |
![]() Microprocessor vibration |
![]() Bad Connector |
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Courtesy of Dan
Borza, INSA Rouen, France. |
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![]() Metallic membrane displacement (ESPI) |
![]() 8*6cm iron plate mode shape (TAHI) |
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Boomerang silicon sample and displacement map (DIC) (automatic object recognition and FEM compliant meshing) |
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All pictures
Courtesy of Pierre Slangen, EMA, France |
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